SERVICES >> CONVENTIONAL NDT

Positive Material (PMI)

X-ray Fluorescence (XRF) Analysis are based on the interaction of matter with x-rays which are short-wavelength, high-energy beams of electromagnetic radiation. XRF analysis utilizes the fact that when a primary x-ray beam strikes a substance, it excites elements at the atomic level, causing electron movement. Each element has characteristic emissions of secondary (fluorescent) x-rays when these movements occur, identifying the elemental composition of the substance. These non-destructive, rapid analysis techniques are widely used to determine the composition of metals, alloys, glass, ceramics, minerals and countless other materials.